Characterization and Evaluation of Materials

An important aspect of materials science is the characterization of the materials that we use or study in order to learn more about them. Today, there is a vast array of scientific techniques available to the materials scientist that enables this characterization. While many characterization techniques have been practiced for centuries, such as basic optical microscopy, new techniques and methodologies are constantly emerging. In particular the advent of the electron microscope and Secondary ion mass spectrometry in the 20th century has revolutionized the field, allowing the imaging and analysis of structures and compositions on much smaller scales than was previously possible, leading to a huge increase in the level of understanding as to why different materials show different properties and behaviors. More recently, atomic force microscopy has further increased the maximum possible resolution for analysis of certain samples.

  • Track 1-1 Electron Microscopy
  • Track 2-2 Scanning Electron Microscopy
  • Track 3-3 Transmission Electron Microscopy
  • Track 4-4 Chemical Analysis in Electron Microscopy
  • Track 5-5 Diffraction Techniques
  • Track 6-6 Principles of Diffraction
  • Track 7-7 X-Ray Diffraction
  • Track 8-8 Neutron Diffraction
  • Track 9-9 Electron Diffraction
  • Track 10-10 Energy Dispersive X-Ray Spectroscopy
  • Track 11-11 Wavelength Dispersive X-Ray Spectroscopy
  • Track 12-12 Electron Energy Loss Spectroscopy

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